Validity and Reliability

Get Started. It's Free
or sign up with your email address
Validity and Reliability by Mind Map: Validity and Reliability

1. Predictive validity is simply refers to the acquiring of test scores to predict a student's future performance.

2. Concurrent assess the correlation of measures that are process at the same time in order to obtain a numerical value

3. Content Validity Evidence is used to evaluate test questions and see if what was taught is included in the test. It is the simplest way to find out whether or not tests have sufficient validity but it does not estimate validity numerically.

4. Construct Validity Evidence refers to the level to which a test or other measure evaluates the basic theoretical construct it is supposed to measure and that the test does not measure irrelevant attributes (Kuybiszyn & Borich, 2010).

5. Criterion-Related Validity mainly looks at the relationship of the test scores and the outcome. For instance, the using of SAT test result can find out if a student will do well in college or not. Two types of criterion include concurrent and predictive

6. Internal Consistency: has two components: split halves-determines the correlation between two halves of the test which may result in odd-even reliability. Odd-even reliability is when test items levels (easy/difficult) are not equally spread around the test, so test will be divided by odd and even numbers.

7. Test-Retest or Stability is measuring the reliability of the test by taking the test twice in two different points in time and then look at the correlation of the first and the second set of scores. Getting the same results is needed in order to determine the reliability of the tests. The interval between testings must take into account in order to get a reliable result.

8. Alternate-form: unlike test-retest, alternate-form measures two different or equivalent tests to the same group of test takers and correlates their scores. Using alternate-form reduces the factor of memorization and practice that may occur in the test-retest method.